■ Technical introduction
Millimeter wave materials are crucial for the development of 5G/B5G mobile communications, and the dielectric characteristic test of these materials is essential for the development of high-frequency materials. To measure the dielectric properties of millimeter wave materials, a high-precision and low-vibration motion system is needed, along with an integrated algorithm that can accurately position the sample at the position with the strongest electric field signal for measurement.
An automatic integration of measurement is also necessary to achieve fast and simple measurement, which provides verification and testing solutions for the dielectric properties of new materials on millimeter waves. Such a measurement system requires careful design and implementation, with attention to factors such as signal processing, accuracy, repeatability, and reproducibility. The system should also be capable of handling different types of materials, as well as various frequency ranges and measurement modes.
Overall, the development of a reliable and accurate dielectric characteristic measurement system for millimeter wave materials is crucial for advancing the field of high-frequency materials and enabling the continued evolution of mobile communication technology.
■ Technical specifications
▣ Millimeter Wave Band Service Items:
• Dielectric properties Measurement (Dk and Df)
• Consultation about materials dielectric properties
• Measurement system construction
• Measurement standard substrates (TAF 3327)
• Line transmission loss verification
▣ Measurement technology services and solutions for dielectric properties of materials in the millimeter wave band typically involve specialized equipment and expertise in the use of high-frequency measurement techniques.
▣ Uncertainty of System
■ Industrial Applications
Millimeter wave material measurement systems can provide valuable information for the development and characterization of new materials in various industries. These systems use electromagnetic waves in the millimeter wavelength range to probe the physical properties of materials, such as their dielectric constant, loss tangent, conductivity, and thickness.
By measuring these properties, the millimeter wave material measurement system can help manufacturers optimize the performance and reliability of their products, such as printed circuit boards (PCBs), flexible boards, ceramic substrates, and packaging materials.
The transmission loss included dielectric loss and conductor loss. Conducting loss dominated by the interface of substrate and metal. The hemispherical Fabry Perot Open Resonator (FPOR) with a reflective structure of signal is good tools for measurement dielectric properties and metal loss.
We demonstrated system to measurement the quality factor of interface and verification interface impedance model.
Overall, millimeter wave material measurement systems can be a valuable tool for improving the quality and performance of materials in various industries, helping to accelerate the development of new products and technologies.
Industrial Technology Research Institute (ITRI)
Material and Chemical Research Laboratories (MCL)
Dept. of Electrical Ceramic Materials and Modules (S400)